FED 53 Exterior dimensions Width (mm) 635 Height (incl. feet) (mm) 620 Depth (mm) 575 Plus door handle and connection (mm) 105 Wall clearance, rear (mm) 100 Wall clearance, side (mm) 160 Exhaust duct (outer Ø mm) 52 Steam space volume (l) 77 Number of doors (ea.) 1   Interior dimensions Width (mm) 400 Height (mm) 400 Depth (mm) 330 Interior volume (l) 53 Racks (number standard/max.) 2 / 5 Load per rack (kg) 15 Permitted total load (kg) 40 Weight (empty) (kg) 44   Temperature data Temperature range approx. 5 °C above ambient temperature to (°C) 300 Temperature variation at 70 °C (± K) 0,8 at 150 °C (± K) 2 at 300 °C (± K) 3,7 Temperature fluctuation at 70 °C (± K) 0,3 Warm-up time 1) to 70 °C (min.) 6 to 150 °C (min.) 24 to 250 °C (min.) 45 to 300 °C (min.) 55 Recovery time after doors were open for 30 sec. 1) at 70 °C (min.) 2 at 150 °C (min.) 5 at 300 °C (min.) 10   Ventilation data Ventilation at 150 °C (x/h) 43 at 300 °C (x/h) 66   Electrical data IP protection class acc. to EN 60529 IP 20 Voltage (± 10%) 50 / 60 Hz (V) 230 Nominal power (kW) 1,2 at 70 °C (W) 162 at 150 °C (W) 397 at 300 °C (W) 933

1) To 98% of the set value

All technical data are specified for units with standard equipment at an ambient temperature of 25 °C and a line voltage fluctuation of ±10%. The temperature data is determined in accordance to factory standard following DIN 12880, respecting the recommended wall clearances of 10% of the height, width and depth of the inner chamber. All figures are typical average values for series devices. We reserve the right to alter technical specifications at any time.

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  Numerous access ports

  With silicone plugs for introducing external measuring instruments into the chamber, access ports with 10, 30, 50, 100 mm diameters.

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  Door with window and interior lighting

  For optimal process control in the inner chamber, available for all device sizes.

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  Door lock

  Prevents unauthorized access to the process sequences in the chamber.

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  Calibration certificate & validation

  BINDER can significantly reduce the workload in qualifying and validating devices. Nobody knows our devices as well and has as much experience in certifications as we do.